3D Laser Scanning Microscope - VK-X200

Dec. 20, 2011
Combining features of an optical microscope, roughness gauge, profilometer, and scanning electron microscope, our laser scanning microscope performs non-contact profile, roughness, and thickness measurements on nearly any material.
By clicking above, I acknowledge and agree to Endeavor Business Media’s Terms of Service and to Endeavor Business Media's use of my contact information to communicate with me about offerings by Endeavor, its brands, affiliates and/or third-party partners, consistent with Endeavor's Privacy Policy. In addition, I understand that my personal information will be shared with any sponsor(s) of the resource, so they can contact me directly about their products or services. Please refer to the privacy policies of such sponsor(s) for more details on how your information will be used by them. You may unsubscribe at any time.